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Ab initio modelling techniques applied to c-Si

PR Briddon, in Properties of Crystalline silicon, No. 20 in EMIS Datareviews Series, edited by Robert Hull (INSPEC, Institute of Electrical Engineers, London, 1999), Chap. 6.9, pp. 300–356


Errors and omissions to Jon Goss

Revised: 10 February 2010 at 11:51 © University of Newcastle upon Tyne, UK