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Ab initio modelling techniques applied to c-Si

PR Briddon, in Properties of Crystalline silicon, No. 20 in EMIS Datareviews Series, edited by Robert Hull (INSPEC, Institute of Electrical Engineers, London, 1999), Chap. 6.9, pp. 300–356

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Errors and omissions to Jon Goss


Revised: 10 February 2010 at 11:51 © University of Newcastle upon Tyne, UK