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The ab initio cluster method and the dynamics of defects in semiconductors

R Jones and PR Briddon, chapter 6 in "Identification of Defects in Semiconductors", volume 51A of Semiconductors and Semimetals (Academic Press, Boston) 1998.

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Errors and omissions to Jon Goss


Revised: 10 February 2010 at 11:51 © University of Newcastle upon Tyne, UK